Strain Effect in Semiconductors, Ed. 1
Theory and Device Applications
- Author
- Sun, Yongke/ Thompson, Scott/ Nishida, Toshikazu
- Publisher
- Springer-Verlag
- Publication Date
- Nov, 2009
- ISBN
- 1441905510 or 9781441905512
- HARDCOVER
- 500 Pages
The delivery time takes 3 to 5 weeks
¥ 13,473 (tax included)
Description
Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices.











